Author:Vinod Naik

Keyphrases

capture window, clock pad, DFT Architecture, enable to block, Hierarchical compatible Test, Internal Scan Resets, Low Pin Test, mini-OCC, provide internal scan reset, race conditions, reset n and retain, reset n clk, reset occ, retention control, Retention flipflop, scan clock, scan data bandwidth, scan enable, scan reset pulse, scan resets, standard dft instrumentation.