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Author
:
Anthony Coyette
Publications
IPP: Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs
Wim Dobbelaere
,
Frederik Colle
,
Anthony Coyette
,
Ronny Vanhooren
,
Nektar Xama
,
Jhon Gomez
and
Georges Gielen
EasyChair Preprint 1509
Keyphrases
activation
,
analog
,
burn-in
,
fault coverage
,
latent defects
,
Quality
,
structured test
,
Vstress
.
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