Download PDFOpen PDF in browserIPP: Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICsEasyChair Preprint 15094 pages•Date: September 13, 2019AbstractThe test and design methodology currently used to develop automotive mixed-signal integrated circuits, is not sufficient to achieve the < 10 PPB quality target. In particular it does not allow to activate and detect all latent defects, which are a significant cause of vehicle failures in the field. This paper discusses whether full burn-in will be needed in order to meet the quality goal, or whether Vstress in combination with defect activation coverage methodology will do the job. Keyphrases: Quality, Vstress, activation, analog, burn-in, fault coverage, latent defects, structured test
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